To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2D materials.
from Top Technology News -- ScienceDaily https://ift.tt/2O5LHtw
Monday, 27 January 2020
Method detects defects in 2D materials for future electronics, sensors
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